The Effect Of Underlayer Thin Films On The Surface-Enhanced Raman Scattering Response Of Ag Nanorod Substrates

Qin Zhou,Yongjun Liu,Yuping He,Zhengjun Zhang,Yiping Zhao
DOI: https://doi.org/10.1063/1.3489973
IF: 4
2010-01-01
Applied Physics Letters
Abstract:The effect of underlayer thin films on the sensitivity of Ag nanorod surface-enhanced Raman scattering (SERS) substrates was studied both theoretically and experimentally. With the same Ag nanorod film, different materials (Ag, Al, Si, and Ti) with different thicknesses (25, 100, and 400 nm) were used as underlayers to alter the reflectivity systematically. The SERS intensity was found to increase linearly with the underlayer reflectivity, which can be explained by a modified Greenler's model due to the contribution of reflected electric field from the substrate. This finding can be used to design high enhancement SERS substrates. (C) 2010 American Institute of Physics. [doi:10.1063/1.3489973]
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