Multi-photon resonant ionization of xenon in the vicinity of 440 nm

Zhenzhong Lu,Deying Chen,Rongwei Fan,Yuanqin Xia,Hongying Zhang
DOI: https://doi.org/10.1109/RCSLPLT.2010.5615386
2010-01-01
Abstract:By combining the pulse molecular beam technique and time of flight mass spectrum, the multiphoton resonance ionization of Xe in the vicinity of 440 nm is studied. The dependence of resonant ionization on laser energy and source pressure of Xe was analyzed and discussed. The resonant ionization spectrum near 440 nm was obtained and the AC Stark effect was determined to be the major cause of asymmetric line broadening in the low pressure multiphoton ionization spectrum of xenon. The results show that spectrum broadening could be ascribed to cooperative effects from different laser energy and electric field. © 2010 IEEE.
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