High-sensitivity transition-edge-sensed bolometers: improved speed and characterization with AC and DC bias
Logan Foote,Michael D. Audley,Charles,Bradford,Gert de Lange,Pierre Echternach,Dale J. Fixsen,Howard Hui,Matthew Kenyon,Hien Nguyen,Roger O'Brient,Elmer H. Sharp,Johannes G. Staguhn,Jan van der Kuur,Jonas Zmuidzinas
DOI: https://doi.org/10.1063/5.0157208
2023-09-14
Abstract:We report on efforts to improve the speed of low-G far-infrared transition-edged-sensed bolometers. We use a fabrication process that does not require any dry etch steps to reduce heat capacity on the suspended device and measure a reduction in the detector time constant. However, we also measure an increase in the temperature-normalized thermal conductance (G), and a corresponding increase in the noise-equivalent power (NEP). We employ a new near-IR photon-noise technique using a near-IR laser to calibrate the frequency-domain multiplexed AC system and compare the results to a well-understood DC circuit. We measure an NEP white noise level of 0.8 aW/rtHz with a 1/f knee below 0.1 Hz and a time constant of 3.2 ms.
Applied Physics,Instrumentation and Detectors