Low power and high speed explicit-pulsed double-edge triggered level converting flip-flop

YanYun Dai,Jizhong Shen
DOI: https://doi.org/10.3772/j.issn.1006-6748.2010.02.017
2010-01-01
Abstract:Variable supply voltage-clustered voltage scaling (VS-CVS) scheme can be very effective in reducing power consumption of CMOS circuits without degrading system performance. Level converting flip-flops (LCFFs) are key elements in the CVS scheme. In this paper, a new explicit-pulsed double-edge triggered level converting flip-flop (nEP-DET-LCFF) is proposed, which employs double-edge triggering technique, dynamic structure, explicit pulse generator, conditional discharge technique and proper arrangement of stacked nMOS transistors to efficiently perform latching and level converting functions simultaneously. The proposed nEP-DET-LCFF combines merits of both conventional explicit-LCFFs and implicit-LCFFs. Simulation shows the proposed nEP-DET-LCFF has improvement of 19.2%~46% in delay, and 19.4%~52.9% in power-delay product (PDP) as compared with the published LCFFs. Copyright © by HIGN TECHNOLOGY LETTERS PRESS.
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