Multi-layered model for radio frequency identification adoption oriented to discrete manufacturing enterprise

白翱,唐任仲,王志国,祁国宁
DOI: https://doi.org/10.3785/j.issn.1008-973X.2009.12.012
2009-01-01
Abstract:A multi-layered model centering on critical success factor/capability maturity model/technology acceptance model(CSF/CMM/TAM) was proposed to improve the efficiency and success rate of radio frequency identification(RFID) adoption for small and medium-sized discrete manufacturing enterprise(SM-DME).Main-obstacles of RFID adoption were analyzed;differences between RFID and other enterprise information systems(EIS) were compared;CSF, CMM and TAM for RFID adoption were researched.Then a multi-layered model for RFID adoption(RFID-AMM) consisting of business layer, application layer, management layer, factor layer, ability layer, user layer, method layer, implementation layer, integration layer and target layer was constructed, and its function mechanism was described using formal language. A RFID adoption assisted analysis platform(RFID-AAAP) was developed to simplify computation.Practical application in a garment manufacturer proves that the proposed model can meet the need of RFID adoption for SM-DME.
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