Fast Solution of Electromagnetic Scattering from Thin Dielectric Coated Conducting Structures by Improved EFIE

Jun Hu,Lin Lei,Zaiping Nie,Shiquan He
DOI: https://doi.org/10.1109/aps.2009.5171650
2009-01-01
Abstract:In this paper, MLFMA is implemented in the IEFIE to compute scattering from complex conducting structure coated by thin dielectric material. Numerical results demonstrate the efficiency and validity of the present method.
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