A Novel Method for Evaluating the Validity of the Visual Attended Regions Based on SIFT Descriptors

Jie Xiao,Mingyue Ding,Chao Cai,Chengping Zhou
DOI: https://doi.org/10.1117/12.832638
2009-01-01
Abstract:Selective visual attention can direct our gaze rapidly towards objects of interest in the view. Better coverage of target region for attention can better serve for recognition. A novel method for evaluating how well the attended regions contribute to the recognition of the target based on SIFT descriptors is proposed in this paper. The method is used to evaluate the attended regions extracted by some visual attention mechanisms on real remote sensor images with different geometric and photometric transformations and for different scene types. The evaluation method proposed in this paper give an explicit, accurate and robust expression about the attended region in visual attention mechanisms and we believe this method could be applicable in visual attention mechanisms in the future work.
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