Abstract:This paper considers the joint geometric and photometric image registration problem. The inverse compositional (IC) algorithm and the efficient second-order minimization (ESM) algorithm are two typical efficient methods applied to the geometric registration problem. Their efficiency stems from the utilization of the group structure of geometric transformations. To allow for photometric variations, the dual IC algorithm (DIC) proposed by Bartoli performs joint geometric and photometric image registration by extending the IC algorithm. The group structures of both geometric and photometric transformations are exploited. Despite the robustness to large photometric variations, DIC is vulnerable to large geometric deformations. The ESM algorithm is extended by Silveira et al. to address photometric variations. In their approach, the photometric transformations are modeled in Euclidean space. Their approach is robust to relatively large geometric and photometric transformations; however, it is not efficient for large photometric variations. We propose a new efficient and robust image registration method by exploiting the non-Euclidean Lie group structure of joint geometric and photometric transformations for both grayscale and color images. The image registration is formulated as a nonlinear least squares problem. In our method, the geometric and photometric transformations are jointly parameterized by their corresponding Lie algebras. Based on this parameterization approach, the second-order approximation strategy of ESM is employed to optimize the joint geometric and photometric parameters. The error function in the nonlinear least squares problem is approximated by a second-order Taylor expansion with respect to joint geometric and photometric parameters without computing the Hessian matrix. For further efficiency, independent convergence criteria for geometric and photometric parameters are used in the iterative optimization process. The superiority of our proposed method over the previous methods, in terms of efficiency, accuracy, and robustness, is demonstrated through extensive experiments on synthetic and real data.

Image Registration By Integrating Similarity And Epipolor Constraints

Developing Structural Constraints for Accurate Registration of Overlapping Range Images

Projecting registration error for accurate registration of overlapping range images

Multi-sensor Images Registration Based on SIFT and Extended Phase Correlation

An Iterative SIFT Based on Intensity and Spatial Information for Remote Sensing Image Registration

A Novel Image Registration Approach Via Combining Local Features and Geometric Invariants

Automatic Remote Sensing Image Registration Algorithm Based on SIFT

Image Registration of Infrared and Visible Image Based on Geometric Constraint

Automatic Remote Sensing Image Registration Based on VTS-PCMIC Algorithm

Multi-source Remote Sensing Image Registration Based on Sift and Optimization of Local Self-Similarity Mutual Information

A Novel Coarse-to-Fine Scheme for Remote Sensing Image Registration Based on SIFT and Phase Correlation

An Image Registration Algorithm Based on Slope and Distance Ratio Constraints

A Remote Sensing Image Registration Algorithm Based On Multiple Constraints And A Variational Bayesian Framework

An automatic image registration method based on SIFT and Harris-Affine features matching

Color and Depth Image Registration Algorithm Based on Multi-Vector-fields Constraints.

Efficient and Robust Direct Image Registration Based on Joint Geometric and Photometric Lie Algebra

Novel Image Registration Method Based on Local Structure Constraints

Remote Sensing Image Registration Based on Local Affine Constraint With Circle Descriptor

Past precise registration algorithm combining image information and geometric relations

Image registration algorithm research using improved multi-scale feature extraction

Algorithm of Sub-Pixel Image Registration Based on Harris Corner and SIFT Descriptor