Research on critical technique of microscan thermal imager

Xiubao Sui,Qian Chen,Guohua Gu,Lei Yu,Xu Han

2008-01-01

Journal of Information and Computational Science

Abstract:The images produced by the detector with finite size and finite spatial sampling rate were promiscuous. An adaptive way to reduce aliasing was microscanning. We presented the analytical model of the microscan process. The model indicates that microscanning can improve spatial sampling rate of the detector. We brought forward and analyzed the critical technique of microscan thermal imager. The key was to ensure every pixel had enough exposure time and almost the same exposure time with each other. According to the formulas of critical technique we developed a microscan thermal imager. The last image and MTF contrast indicate that the performance of microscan thermal imager of which critical technique is resolved is better than usual thermal imager without microscanning.