True Worst-Case Clock Skew Estimation Under Process Variations Using Affine Arithmetic

Jun Fang,Waishing Luk,Wenqing Zhao
IF: 1.019
2007-01-01
Chinese Journal of Electronics
Abstract:With the shrinking of IC feature size, clock skew uncertainty is introduced due to the presence of process variations, which significantly affects high-speed clock-tree performance. Affine arithmetic is adopted to capture both circuit topological correlation and process parameter spatial correlation. An affine arithmetic based method is proposed for true worst-case clock skew estimation. The proposed method is tested on circuit examples. We demonstrate the accuracy of the proposed method by comparing our results with Monte Carlo simulation.
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