Abstract:We present an efficient method for evaluating current-induced forces in nanoscale junctions, which naturally integrates into the nonequilibrium Green's function formalism implemented within density functional theory. This allows us to perform dynamic atomic relaxation in the presence of an electric current while evaluating the current-voltage characteristics. The central idea consists of expressing the system energy density matrix in terms of Green's functions. To validate our implementation, we perform a series of benchmark calculations, both at zero and at finite bias. First we evaluate the current-induced forces acting over an Al nanowire and compare them with previously published results for fixed geometries. Then we perform structural relaxation of the same wires under bias and determine the critical voltage at which they break. We find that although a perfectly straight wire does not break at any of the voltages considered, a zigzag wire is more fragile and snaps at 1.4 V, with the Al atoms moving against the electron flow. The critical current density for the rupture is estimated to be 9.6 x 10(10) A/cm(2), in good agreement with the experimentally measured value of 5 x 10(10) A/cm(2). Finally, we demonstrate the capability of our scheme to tackle the electromigration problem by studying the current-induced motion of a single Si atom covalently attached to the sidewall of a (4,4) armchair single-walled carbon nanotube. Our calculations indicate that if Si is attached along the current path, then current-induced forces can induce migration. In contrast, if the bonding site is away from the current path, then the adatom remains stable regardless of the voltage. An analysis based on decomposing the total force into a wind and an electrostatic component, as well as on a detailed evaluation of the bond currents, shows that this remarkable electromigration phenomenon is due solely to the position-dependent wind force.

Motion of electron gas and the induced nanofilm electromigration

Thermionic Energy Conversion with Nanoscale Materials and Devices

Current-Induced Energy Barrier Suppression For Electromigration From First Principles

Phase-Field-Crystal Model for Electromigration in Metal Interconnects.

First-Principles Quantum Transport Theory of the Enhanced Wind Force Driving Electromigration on Ag(111)

Connecting the phase-field-crystal model of electromigration with electronic and continuum theories

Equilibrium Current Density Balancing Two Atomic Flows in Coupled Problems of Electromigration and Thermomigration in Unpassivated Gold Film

Electromigration Simulation for Metal Lines

Comparison of the Time-Dependent Physical Processes in the Electromigration of Deep Submicron Copper and Aluminum Interconnects

Electrofluid Dynamic (EFD) Energy Conversion in Gas Flows with Suspended Nanoparticles

Electric Current-Driven Migration of Electrically Neutral Particles in Liquids

Self-Flow Via Upwind Electromigration Of Nanoliquid Bridge

Viscous current-induced forces

Electromigration Effects Upon Interfacial Reactions

Electromigration-Induced Evolution of Micromorphology and Electrical Properties in Gold Nanowires: Implications for Nanoelectronics

Peridynamic modeling of void nucleation and growth in metal lines due to electromigration in a finite element framework

3D Kinetic Monte Carlo Simulation of Electromigration in Multi-layer Interconnects

Theory of Electromotive Force Induced by Domain Wall Motion

Thermoelectric effect and temperature-gradient-driven electrokinetic flow of electrolyte solutions in charged nanocapillaries

Local Fields in Conductor Surface Electromigration: A First-Principles Study in the Low-Bias Ballistic Limit

Damage Nucleation During Electromigration along an Isolated Interface in an Elastic Medium