Distribution and evolution of thermal field formed by intense pulsed ion beam on thin metal target
xiao yu,jie shen,miao qu,haowen zhong,jie zhang,yanyan zhang,sha yan,gaolong zhang,xiaofu zhang,xiaoyun le
DOI: https://doi.org/10.1016/j.nimb.2015.07.061
2015-01-01
Abstract:Intense pulsed ion beam (IPIB) is characterized by short-pulsed high power density. With the strong thermal effect in the surface as the dominating feature, IPIB is an ideal technique for flash-heating surface processing of materials, especially for metals and alloys. Thus, the understanding of formation and evolution of thermal field induced by IPIB irradiation is of great significance to their application and diagnostic techniques. Due to the short pulsed duration and high energy flux of IPIB, the study in this field was so far mainly yield to numerical simulation. In this paper, with a combination of infrared image diagnostics, numerical analysis using Monte Carlo (MC) and finite element methods (FEM), the distribution and evolution of thermal field formed by IPIB produced by a magnetically insulated diode on a thin metal target was studied. The evolution of the thermal field and its effects on applications, such as the design of calorimeters was discussed reasonably.