Abstract:High resolution analog-digital conversion (ADC) is a key instrument to convert analog signals to digital signals, which is deployed in data acquisition system to match high resolution analog signals from seismometers systems. To achieve high resolution, architecture of Σ-△ oversampling or pipeline ADC architecture have following disadvantages: high power consumption, low linearity of modulators, and complex structure. This work presents a novel model architecture, which design principle is validated by mathematical formulations which combined advantages of both pipeline and Σ-△oversampling ADC architecture. By discussing the adverse effects of the whole ADC architecture with an external noise theoretically, an amended theoretical model is proposed according to the assessment result of a noise simulation algorithm. The simulation results represent that the whole performance of combined architecture is determined by the noise level of integrator and subtractor. Using these two components with a noise index no more than 10-7 V/√Hz, the resolution of the prototype can achieve a reservation of 144.5 dB.

A Systematic Error Model of High-Resolution Pipelined Analog-to-Digital Converters

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

Modeling of digital background calibration with signal-dependent dithering for a 14-bit, 100-MS/s pipelined ADC

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

Analysis and Modeling of Dynamic Error in Current-Steering DAC

A Calibration Technique Based on Frequency-Domain Characteristics for Pipelined ADCs

Analysis and Modeling of the Glitch Error in Current-Steering D/A Converter

Error Analysis and System Design of High-Accuracy Pipelined A/D Converters

A Maximum-Likelihood-Estimation-Based Digital Background Calibration Technique for Interstage Gain Error in Pipelined ADCs

A 14bit 500MS/s 85.62dBc SFDR 66.29dB SNDR SHA-less pipelined ADC with a stable and high-linearity input buffer and aperture-error calibration in 40nm CMOS

Optimizing for High Resolution ADC Model With Combined Architecture

A 14-bit 500MS/s and 1GS/s Configurable Pipelined ADC with Background Calibration

A Pipelined Interpolating Analog-to-Digital Converter with Reduced Nonlinearity Error

An Efficient Calibration Technique for Pipeline ADC.

A Novel Digital Calibration With Low Complexity For Pipelined Adc

LMS-based calibration of pipelined ADCs including linear and nonlinear errors

A 10-bit 30-MS/s 50mW pipelined A/D converter

A 10-bit 20-Msample/s 49mW CMOS pipelined A/D converter

Resolution Analysis of the First Stage in the High Precision Pipelined ADCs

A Digital Calibration Technique with High Speed and Low Complexity

A High Linearity,13bit Pipelined CMOS ADC