Optimizing Build Parameters for Improving Dimension Accuracy of High-resolution Stereolithography System

Xu Guangshen,Zhang Xiqiang,Zhu Jinxiong,Zhao Wanhua,Lu Bingheng
DOI: https://doi.org/10.3321/j.issn:1004-132X.2006.06.003
2006-01-01
Abstract:To improve the dimension accuracy in scanning plane, an experimental investigation had been carried out to determine the optimum build parameters of high-resolution stereolithography (SL) system with Taguchi method. The building parameters are laser beam scanning speed (factor A), cured line width compensation factor (factor B), hatch spacing (factor C) and xy-shrinkage compensation factor (factor D). By using analysis of variance (ANOVA), it is found that factor C, factor D and the interaction between factor A and factor C significantly affect the dimension accuracy, and the interaction between A and B, the interaction between A and D, also have effects on the dimension accuracy. Based on the experimental results, an optimum factor combination of the high-resolution SL system was concluded. With the optimum factor combination, an error of 0.003 mm in the horizontal X and Y dimension has been reached using the high-resolution SL system. Confirmation experimental results show that the dimension accuracy has been significantly improved with the optimum factor combination.
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