Application of Near Infrared Spectroscopy to Predict Plant Diseases

Huirong Xu,Yibin Ying,Zunzhong Ye
DOI: https://doi.org/10.1117/12.628458
2005-01-01
Abstract:The objectives of this study were to characterize leaf reflectance spectra of tomato leaves damaged by leaf miner and to determine those leaf reflectance wavelengths that were most responsive to plant damage caused by the pest. Near infrared (NIR) Spectral characteristics of single tomato leaves at various levels of infestation by the leaf miner, were measured and analyzed using a spectrometer. Tomato leaf damage was classified into five scales, i.e., 0 (no damage), 1 (light damaged), 2 (10-25% damaged), 3 (more than 25% damaged), and 4 (severe damaged), based on the scale of infestation displayed on the surfaces of plant parts. Spectral parameter such as reflectance sensitivity was used to find the optimal wavelengths to determining and evaluating the damage level. Results showed that there were significant differences in reflectance among infestations at wavelengths of 1450nm and 1900 nm particularly. The determining coefficients (R2) for a linear relationship were 0.98 and 0.91 for the spectral-infestation levels relations. Thus, both of these wavelengths were good indicators of leaf senescence caused by the leaf miner.
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