Abstract:Oftentimes, the power dissipation during the test mode far exceeds the power ratings of the normal operation mode. Hence, there is a need to reduce power during the test mode so that power ratings are not violated and chips do not get burnt during the application of test. Power consumption during built-in-self-test (BIST) operation can be minimized while achieving high fault coverage. Simple measures of observability and controllability of circuit nodes are proposed based on primary input signal probability (probability that a signal is logic ONE). Such measures help determine the testability of a circuit. We developed a tool, POWERTEST, which uses a genetic algorithm based search to determine optimal probability sets (signal probabilities or input signal distribution) at primary inputs to tradeoff test time versus power dissipation and fault coverage. The inputs conforming to the primary input probability-activity sets can be generated using cellular automata or linear feedback shift register (LFSR). We observed that a single input distribution (or weights) may not be sufficient for some random-pattern resistant circuits, while multiple distributions consume larger area. As a tradeoff, two distributions have been used in our analysis. Results on ISCAS benchmark circuits show that power reduction of up to 94.86% and energy reduction of up to 99.93% can be achieved (compared to equi-probable random-pattern testing) while achieving high fault coverage.

Power Analysis of Combinational Circuits Based on Transition Entropy

A Transition Entropy Area Estimation Method for Combinational Circuits

A novel entropy measurement on register transfer level area and power estimation

Research on power analysis of CMOS combination logic circuits

Design of probabilistic-based Markov Random Field logic gates in 65nm CMOS technology

New approach on power estimation of CMOS sequential logic circuits

A novel probabilistic approach for power estimation of unit-delay combinational circuits

An energy and information analysis method of logic gates based on stochastic thermodynamics

An efficient algorithm for estimating gate-level power consumption in large-scale integrated circuits

Information Energy Ratio of XOR Logic Gate at Mesoscopic Scale

Power consumption estimation in CMOS VLSI chips

Input Transition Sensitive Power Models of Function Units

A Leakage Power Estimation Method for Standard Cell Based Design

Leakage power reduction for CMOS combinational circuits

Low-power Weighted Random Pattern Testing

Sequence Compaction for Fast Simulating Average Power Dissipation of CMOS Circuits: Theory and Practice

Statistical analysis of full-chip leakage power for 65nm CMOS node and beyond

Fluctuating Power Logic: SCA Protection by V-DD Randomization at the Cell-level

Design and Evaluation of Fluctuating Power Logic to Mitigate Power Analysis at the Cell Level

Power and Area Optimization of XOR/AND Circuits Based on Quantum Genetic Algorithm

Stochastic thermodynamic bounds on logical circuit operation