Novel Correction Formula of Strip Width for CPW with Nonzero Metallization Thickness
蒋振新,丁桂甫,杨春生,张永华,沈民谊
DOI: https://doi.org/10.3321/j.issn:0372-2112.2004.09.032
2004-01-01
Tien Tzu Hsueh Pao/Acta Electronica Sinica
Abstract:Approximate conformal mapping technique has been employed to analyze the effect of finite metellization thickness of CPW theoretically, therefore numerical computations and some corresponding numerical processes are carried out. As a result, a new accurate correction formula of strip width is presented. In addition, the closed form formulas of characteristic impedance and attenuation are derived from it. Finally, the computation results based on these new formulas are compared with those of K. C. Gupta formulas and experimental values. It shows that the errors of new formulas are dramatically decreased, which are only 13.0-31.3% of K.C. Gupta formula's. This results suggest that the new formulas will play an important role in characterizing CPW precisely instead of K. C. Gupta formula.
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