Abstract:Context: The Incremental Covering Array (ICA) offers a flexible and efficient test schedule for Combinatorial Testing (CT) by enabling dynamic adjustment of test strength. Despite its importance, ICA generation has been under-explored in the CT community, resulting in limited and suboptimal existing approaches. Objective: To address this gap, we introduce a novel strategy, namely Top-down , for optimizing ICA generation. Method: In contrast to the traditional strategy, named Bottom-up , Top-down starts with a higher-strength test set and then extracts lower-strength sets from it, thus leveraging test case generation algorithms more effectively. Results: We conducted a comparative evaluation of the two strategies across 17 real-world software with 84 total versions. The results demonstrate that compared with Bottom-up , the Top-down strategy requires less time and generates smaller ICAs while covering more higher-strength interactions. Furthermore, Top-down outperforms Bottom-up in early fault detection and code line coverage, while also surpassing the random and direct CA generation strategies. Conclusion: The Top-down strategy not only improved the efficiency of test case generation but also enhanced the effectiveness of fault detection in the incremental testing scenarios.

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