Analysis of Aberration Characteristics for Etched Diffraction Grating

宋军,梅维泉,文泓桥,何赛灵
DOI: https://doi.org/10.3969/j.issn.1674-4926.2003.10.020
2003-01-01
Abstract:A simple and effective method for calculating the wave aberration for an etched diffraction grating (EDG) demultiplexer is presented. The design is analyzed and demonstrated using Kirchhoff diffraction integral, an angular-spectrum analysis, and a fast Fourier transform method. It is shown that the symmetry of the spectral response and the coupling efficiency will be deteriorated when the coma appears during the diffraction and imaging. The spherical aberration will result in a larger crosstalk as compared to the coma. It is also shown that the crosstalk characteristic can not be improved better by connecting a tapered waveguide at the entrance of each output waveguide of the demultiplexer.
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