Dielectric Relaxation Studies of Bi-doping Effects on the Oxygen-Ion Diffusion in La2−xBixMo2O9 Oxide-Ion Conductors

XP Wang,QF Fang,ZS Li,GG Zhang,ZG Yi
DOI: https://doi.org/10.1063/1.1518151
IF: 4
2002-01-01
Applied Physics Letters
Abstract:Two dielectric relaxation peaks associated with oxygen-ion diffusion in the oxide-ion conductors La2−xBixMo2O9 (x=0.05, 0.1, and 0.15) have been studied. It is found that the activation energies of the two peaks increase with increasing Bi-doping concentration, which results from the blocking effects of the lone-pair electrons of Bi3+ ions. From the different effects of Bi doping on the two peaks, the diffusion paths of oxygen ions corresponding to each peak are confirmed. Significantly, it is revealed that Bi doping could enhance the ionic conductivity of La2Mo2O9 at lower temperatures.
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