Abstract:The peaks' overlapping often exists in Raman spectroscopy analysis, because of the low spectral resolution of the spectrograph and the complex sample components. The overlapped peaks lead to the errors in peak parameters extraction easily, and at last lead to the analysis error of sample components, which increases the difficulty in automatic analysis of field spectra. The identification of overlapped peaks is the key difficulty of in-situ spectra analysis. To solve this problem, an automatic method of identifying the overlapped peaks was established basing on an analysis model with multiple Gaussian shape peaks. The peak number and the initial parameters(the peak position, peak height, and width) were obtained by symmetric zero-area transformation firstly, and then the parameters were optimized by Levenberg-Marquardt fitting method eventually. Some algorithm experiments were executed to test the method respectively by simulated data and Raman spectra data, and the former showed that the symmetric zero-area transformation method can extract the initial peak parameters with high accuracy, and then converges fast, and is adaptive to signal with wide dynamic range of SNR, but has false and omissive peaks to low SNR signal. The research results show that the automatic method of identifying the overlapped peaks with symmetric zero-area transformation combined with L-M fitting has a certain practical value.

Deconvolution Of Overlapped Asymmetric Chromatographic Peaks

Resolution of Completely Overlapping Chromatographic Peaks by First Differentiation of Two-Way Data

Qualitative and quantitative resolution of hyphenated overlapping chromato-graphic peaks of chiral drugs

Overlapping-peak Resolution and Quantification Using Derivative Spectrophotometry in Capillary Electrophoresis

A Novel Chromatographic Peak Alignment Method Coupled with Trilinear Decomposition for Three Dimensional Chromatographic Data Analysis to Obtain the Second-Order Advantage

Deconvolution in one-dimensional chromatography by heuristic evolving latent projections of whole profiles retention time shifted by simplex optimization of cross-correlation between target peaks

Quantitative Determination of the Components in Overlapping Chromatographic Peaks Using Wavelet Transform.

Unique resolution of hidden minor peaks in multidetection chromatography by first-order differentiation and orthogonal projections

[Rapid Resolving Algorithm of Gas Chromatographic Overlapping Peaks Based on the Asymptotic Expansion of Integration].

A New Method To Resolve Overlapped Voltammetric Peaks

Qualitative and quantitative analysis of two-dimension chromatographic/spectroscopic data with overlapping peaks (I) - Resolution of two-dimension chromatographic/spectroscopic data of phenols with overlapping peaks

Semiautomatic Deconvolution Of Hyphenated Chromatographic Data

[Immune Algorithm: a New Chemometrics Tool for Resolution of Multicomponent Overlapping Chromatographic Signals].

2Nd-Order Spline Wavelet Convolution Method in Resolving Chemical Overlapped Peaks

Recursive Evolving Spectral Projection For Revealing The Concentration Windows Of Overlapping Peaks In Two-Way Chromatographic Experiments

[Automatic Recognition of Overlapped Spectral Peaks by Combined Symmetric Zero-Area Conversion and L-M Fitting].

REALISATION OF A CHROMATOGRAPHIC PEAK RECOGNITION ALGORITHM

Heuristic evolving latent projections: Resolving hyphenated chromatographic profiles by component stripping☆

Study on Resolution and Analysis Method of Stripping Voltammetric Overlapped Peaks

Gas Chromatography-Mass Spectrometry Data Analysis Algorithm Based on Sparse Model and Its Application in Resolving Severely Overlapped Peaks

Incorporating the Prior Information of Spectra into Identification of Elution Region in Hyphenated Chromatography