A New Fourier Transform Profilomerty Based on Modulation Measurement

XY Su,LK Su,WS Li
DOI: https://doi.org/10.1117/12.354824
1999-01-01
Abstract:This article propose a new Fourier transform profilometry based on modulation measurement. We briefly carl it FTP based on MM. Its main advantage is that it can measure the surface of a complex object in the same direction of projecting light, so it has no the difficulties due to shadow and spatial discontinuity that exist in conventional FTP and also PMP methods. In the paper, we give the principle of the method, the set-up of measurement system, and some primary experiment results. The results proved that this method is a promising method for acquiring 3-D data of complex object.
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