Improving the processing speed of an optoelectronic morphological industrial inspection processor

Haisong Liu,Minxian Wu,Guofan Jin,Qingsheng He,Yingbai Yan

DOI: https://doi.org/10.1117/12.341140

1999-01-01

Abstract:In this paper, we present several methods to improve the processing speed of an optoelectronic morphological industrial inspection processor, which uses an incoherent correlator as its optical hardware and the extensive complementary encoding morphological hit-or-miss transform as its detection algorithm. The first method is using a multi-channel correlation scheme, in which four database images are processed simultaneously so that the LCD panel needs only update 25 times for a set of 100 images, for instance. The second method is using a postprocessing method for the optical correlation output plane. An absolute difference measurement (ADM) algorithm is applied for measuring the similarity of the optical correlation resultant images, and then the similarity between the tested and the reference image can be deduced. By this method, the complicated preprocessing procedure including the extensive complementary encoding can be simplified because we can directly deal with the gray-scale images. The third method is using a photoreactive correlator instead of the incoherent correlator so that there is no the update rate limitation of the LCD panel, which was a main problem facing any optoelectronic hybrid system.