Non-destructive Analysis and Appraisal of Paper-Like Objects

HS Cheng,YF Ding,WQ He,FJ Yang
DOI: https://doi.org/10.1016/s0168-583x(97)00759-3
1998-01-01
Abstract:This paper reports the experimental results of external proton beam radiation damage on paper. The damage effect was observed by the tensile strength degradation and the change of the structure measured by XRD. The limit doses of 2.5–3.5 MeV proton beam for some kinds of paper are given. This paper also reports the experimental results of the identification of some Chinese stamps of different editions. The proton induced X-ray emission (PIXE) method has also been used to identify forged notes, including false Renminbi and US Dollar found in China. The PIXE spectrum measured from the forged notes shows that the elemental composition is different from that of genuine ones. The PIXE spectra from the forged notes made by different counterfeiters are different from each other. So the PIXE method is a helpful tool to unveil the provenance of the forged notes.
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