Electronic speckle interferometry video phase-locked system

Kaiduan Yue,Chuangshe Wang,Yushan Tan

1997-01-01

Abstract:There are many methods of ESPI (electronic speckle phase-locked) system. The purpose is to eliminate the error of measurement caused by vibration of objects and disturbance of air. This paper proposed an video phase-locked system. It can eliminate the influence caused by vibration of objects and disturbance of air effectively.

What problem does this paper attempt to address?

Novel Phase-Locked Electronic Speckle Pattern Interferometry

KD Yue,F Zhang,CS Wang,YS Tan

DOI: https://doi.org/10.1117/12.269848

1997-01-01

Abstract:The theory, design, and characteristics of a Phase-locked Electronic Speckle Pattern Interferometry (ESPI) are described. The main principle of the Phase-lock system is to use the characteristics of spatial frequency of the object light to get the information of the phase of the objects' vibration and the disturbance of air. By using the information, we eliminate not only the influence of the objects' vibration, but also the influence of the disturbance of the air. So we can get more stable image of ESPI, and more reliable measurement result.
The System of Double-Optical-path ESPI for the Vibration Measurement

SH Jia,KD Yue,YS Tan

DOI: https://doi.org/10.1016/s0143-8166(00)00060-9

IF: 5.666

2000-01-01

Optics and Lasers in Engineering

Abstract:In this paper, a system of double-optical-path electronic speckle pattern interferometry (ESPI) for measuring larger vibration is proposed. This system combines the conventional ESPI optical path for measuring out-of plane vibration and the de-sensitized optical path. It can be used to observe qualitatively and analyze quantitatively the vibration mode. At the same time, the phase unwrapping is avoided. The anti-disturbance capability of this system is high, so it can be used to analyze the vibration characteristics of complex and discontinuous structure in actual engineering.
Phase Error Correction by &Lt;inline-Formula><math Display="inline" Overflow="scroll"><mi>π</mi></math></inline-Formula>-shift Odd-Step Fringe Projection and Speckle Filtering in Phase Measuring Profilometry

Shuangqing Wu,Sanyuan Zhang,Yin Zhang,Xiuzi Ye

DOI: https://doi.org/10.1117/1.3407430

IF: 1.3

2010-01-01

Optical Engineering

Abstract:Phase measuring profilometry based on structured illumination with a digital projector has great flexibility. However, the phase error introduced by the gamma nonlinearity of the projector and the presence of speckle noise inevitably decreases the accuracy and resolution of the measurement. This paper presents a new phase error correction algorithm by which the odd-step fringe projection is done twice with an initial phase shift of π between, and the two captured deformed fringe images are then digitally subtracted. The speckle noise is further suppressed by applying a sine-cosine median filter. Both theoretical analysis and experimental results showed that this algorithm is effective and fast.
Angle measurement method of electronic speckle interferometry based on Michelson interferometer

Zhu Siyuan,Li Tao,Chen Zhongshan,Li Xin

2024-11-20

Abstract:{This paper proposes an angle measurement method based on Electronic Speckle Pattern Interferometry (ESPI) using a Michelson interferometer. By leveraging different principles within the same device, this method achieves complementary advantages across various angle ranges, enhancing measurement accuracy while maintaining high robustness. By utilizing CCD to record light field information in real time and combining geometric and ESPI methods, relationships between small angles and light field information are established, allowing for the design of relevant algorithms for real-time angle measurement. Numerical simulations and experiments were conducted to validate the feasibility and practicality of this method. Results indicate that it maintains measurement accuracy while offering a wide angle measurement range, effectively addressing the limitations of small angle measurements in larger ranges, showcasing significant potential for widespread applications in related fields.

Applied Physics,Instrumentation and Detectors
Phase-coded Speckle Illumination for Laser Fourier Ptychographic Microscopy

Xiao Tao,Jinlei Zhang,Peng Sun,Chang Wang,Chenning Tao,Rengmao Wu,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2021.127199

IF: 2.4

2021-01-01

Optics Communications

Abstract:It remains a tough task for designing a microscopy system to approach the diffraction limit over a wide field of view due to its restricted space bandwidth product (SBP). Fourier ptychographic microscopy (FPM) has been developed to broaden the SBP of a conventional microscope platform without major hardware modifications. In this paper, we propose a novel FPM system based on the phase-coded speckle illumination, termed PSI-FPM, which employs a laser source with a speckle illumination control optical system. A phase-only spatial light modulator (SLM) with a condenser lens is utilized in the PSI-FPM system to project the phase-coded speckle illumination patterns onto the sample. The convolution between the sample spectrum and the illumination spectrum in the Fourier domain extend the numerical aperture of the objective that acts as a low-pass filter with cut-off frequency. The SLM is introduced in the PSI-FPM system to produce the specific illumination patterns so that the number of the captured images used for reconstruction are greatly reduced. In addition, the generated pattern is scanned to different directions without mechanical movement, which improves the robustness of the system. The PSI-FPM system is validated against simulations and experiments, and as a result reconstructs high-resolution images once the phase retrieval algorithm is employed. We envision that the PSI-FPM system will be suitable for many other speckle imaging applications.
Ghost Imaging with N-order Speckle Light

Yi Chen,Zhengdong Cheng,Yubao Cheng,Bin Zhu,Xiang Zhai

DOI: https://doi.org/10.1117/1.oe.57.7.073111

IF: 1.3

2018-01-01

Optical Engineering

Abstract:Ghost imaging is an indirect system that allows the imaging of an object without directly seeing the object. The speckle pattern that contains the information about light and objects has increasingly become a popular topic in pseudothermal light ghost imaging. However, existing research still has encountered problems of poor imaging quality and slow sampling speeds. We propose a ghost imaging method based on N-order speckle patterns to recover the object (NSGI). The N-order speckle patterns combine N independent laser speckles individually produced by passing an expanded and collimated He-Ne laser through a digital micro-mirror device (DMD). The sampling frequency can be improved by controlling the trigger signals of different DMDs. The results of the simulation and experiment have verified that our method can increase sampling speed and reconstruction accuracy. In addition, NSGI can be applied to more applications by designing multiple independent speckles with different properties. (C) 2018 Society of Photo-Optical Instrumentation Engineers (SPIE).
Image processing of ESPI based on measurement the welding dynamic displacement fields

Jun Tao,Dongging Li,Chenglei Fan,Zhongguo Liu

DOI: https://doi.org/10.3969/j.issn.1004-5341.2004.02.007

2004-01-01

Abstract:A dual-beam electronic speckle pattern interferometry (ESPI) system was adopted to get speckle patterns for the measurement of welding dynamic displacement fields. The mathematical model of this system was described, based on which the methods of ESPI pattern image processing were discussed. Gray transformation and histogram equalization were used to enhance the contrast of speckle patterns. A discrete cosine image processing method was carried out and an exponent low-pass filter was chosen to reduce multiplicative noise in speckle patterns. Speckle grain noise can be eliminated effectively after these processes.
Phase continuous scanning ESPI technique for measuring vibration mode

Shuhai Jia,Kaiduan Yue,Yushan Tan

2000-01-01

Abstract:The phase continuous scanning is combined with the sinusoidal phase modulation to determine the vibration amplitude of object by time-average ESPI (electron speckle pattern interferometry). Because the phase continuous scanning technique is adopted, this method has the advantage of a high antidisturbance capability without exactly calibrating the optical phase-shifter.
Electronic Speckle-Shearing Patten Interferometry for Vibration Analysis

JING Chao,JING Wen-cai,XU Tian-hua,LIU Na,ZHOU Ge,ZHANG Yi-mo

DOI: https://doi.org/10.3969/j.issn.1672-6030.2006.01.008

2006-01-01

Nanotechnology and Precision Engineering

Abstract:Electronic speckle-shearing patten interferometry (ESSPI) has been applied for non destructive tes-ting(NDT) , strain analysis,vibration analysis and flow field analysis as a kind of high - precision full - field measurement. ESSPI is applied for vibration analysis in this paper. The theory of time - average method is analyzed in this paper,and the optical structure of ESSPI is designed for achieving vibration analysis of large area. The rectangle area of 669 mm ×502 mm is once measured by ESSPI. Random height function of surfaces of Gauss correlation and images of speckle - shearing Patten stripes engendered by vibration are simulated by computer. It is proved that ESSPI can be applied for vibration analysis.
High/Low-Precision Digital Speckle Pattern Interferometry for Vibration Measurement

Shuhai Jia,Kaiduan Yue,Hong Zhao,Yushan Tan

DOI: https://doi.org/10.3321/j.issn:0253-987X.2000.09.017

2000-01-01

Abstract:High/low-precision digital speckle pattern interferometry (DSPI) is proposed for measuring vibration. The system combines the common DSPI optical path for measuring out-plane vibration and the de-sensitized optical path. High and low precision measurements are made such that the wrapped phase map obtained with high precision can be unwrapped according to that for the low precision. The effectiveness of the unwrapping procedure at the discontinuous area makes it possible to analyze the vibration characteristics of a complex and discontinuous structure for engineering application.
Design and experiment of electronic speckle shearing phase-shifting pattern interferometer

Tianhua Xu,Chao Jing,Wencai Jing,Hongxia Zhang,Dagong Jia,Yimo Zhang

DOI: https://doi.org/10.48550/arXiv.1602.06975

2016-02-22

Instrumentation and Detectors

Abstract:An electronic speckle shearing phase-shifting pattern interferometer (ESSPPI) based on Michelson interferometer was based in this paper. A rotatable mirror driven by a step motor in one of its reflective arm is used to generate an adjustable shearing and the mirror driven by piezoelectric transducer (PZT) in the other reflective arm was used to realize phaseshifting. In the experiments, the deformation of an aluminum plate with the same extern-force on different positions and different forces on the same position is measured. Meanwhile, the phase distribution and phase-unwrap image of the aluminum plate with the extern-force on its center position is obtained by the four-step phase-shifting method.
Dynamic Phase Evaluation in Sparse-Sampled Temporal Speckle Pattern Sequence

Y. H. Huang,Y. S. Liu,S. Y. Hung,C. G. Li,Farrokh Janabi-Sharifi

DOI: https://doi.org/10.1364/ol.36.000526

IF: 3.6

2011-01-01

Optics Letters

Abstract:The rapid progress of modern manufacturing technology has posed stringent requirements for inspecting techniques for vibration characterization and dynamic testing. Because of its simplicity, accuracy, and whole-field character, speckle interferometry has served as one of the major techniques for dynamic measurement, where normally a dense-sampled temporal speckle sequence is captured for phase retrieval using Fourier or wavelet transforms. In this Letter, a method is proposed for phase evaluation of sparse-sampled speckle patterns when the sampling rate is lower than two points per temporal cycle. Dynamic experiments using a high-speed camera demonstrated the effectiveness of the proposed method for complicated wrapped phase retrieval in electronic/digital speckle pattern interferometry.
New Optical Head and System of Espi

XP WU,LY PANG,HB ZHANG

DOI: https://doi.org/10.1117/12.165481

1993-01-01

Abstract:A new optical head for an electronic speckle pattern interferometer (ESPI) has been designed. The special design is that of a diffuser and a mirror instead of all optical elements and mechanisms of the existing optical head. Another special design is that of a double frequency grating adopted as a shearing element. The new optical head can be operated as a double beam speckle interferometry and shearography. It is light in weight and has very good anti- disturbance function. The experiments are successful when they are combined with an image processing card and software.
Vibration Analysis Based on Electronic Stroboscopic Speckle--Shearing Pattern Interferometry

Dagong Jia,Changsong Yu,Tianhua Xu,Chao Jin,Hongxia Zhang,Wencai Jing,Yimo Zhang

DOI: https://doi.org/10.1117/12.806992

2009-01-01

Abstract:In this paper, an electronic speckle-shearing pattern interferometer with pulsed laser and pulse frequency controller is fabricated. The principle of measuring the vibration in the object using electronic stroboscopic speckle--shearing pattern interferometer is analyzed. Using a metal plate, the edge of which is clamped, as an experimental specimen, the shear interferogram are obtained under two experimental frequencies, 100 Hz and 200 Hz. At the same time, the vibration of this metal plate under the same experimental conditions is measured using the time-average method in order to test the performance of this electronic stroboscopic speckle-shearing pattern interferometer. The result indicated that the fringe of shear interferogram become dense with the experimental frequency increasing. Compared the fringe pattern obtained by the stroboscopic method with the fringe obtained by the time-average method, the shearing interferogram of stroboscopic method is clearer than the time-average method. In addition, both the time-average method and stroboscopic method are suited for qualitative analysis for the vibration of the object. More over, the stroboscopic method is well adapted to quantitative vibration analysis.
Low-frequency harmonic vibration analysis with temporal speckle pattern interferometry

Xide Li,Gang Tao

DOI: https://doi.org/10.1016/S0030-3992(02)00013-0

IF: 4.939

2002-01-01

Optics & Laser Technology

Abstract:In this paper, the time sequence phase method (TSPM) has been applied to measure the displacement caused by low-frequency vibration in temporal speckle pattern interferometry (TSPI). The principle is that by capturing the temporal speckle patterns related to the object vibration, the whole-field displacement responses (amplitude and phase) of the vibrating object can be calculated through scanning these fluctuations. Thus, quantitative measurement can be carried out using a conventional ESPI system without a camera synchronized to the object vibration or a phase shifting system. The elaboration on the method is given and experimental results are presented.
Filtering Method for Phase Fringe Patterns in the Digital Speckle Pattern Interferometry

Yonghong Wang,Weihua Bu,Junrui Li,Jianfei Sun,Lianxiang Yang

DOI: https://doi.org/10.1117/12.2014792

2013-01-01

Abstract:The phase fringe patterns obtained by the phase shifting technique are inherently full of speckle noise in Digital Speckle Pattern Interferometry (DSPI),. The phase fringe patterns filtering method is very important to obtain the precisely deformation information. In this paper a effective method for filtering the speckle noise of phase fringe patterns is applied, the method filter the discrete images which generated from phase fringe patterns instead of classical filtering phase fringe patterns directly. Comparing with existed filters method, it has a better performance on phase jump information preservation and does not have any blurring effect on the phase distribution providing the filtering is implemented on the equal-phase window. Moreover, its capability of noise reduction is more powerful. An optical measurement system based on DSPI is built to demonstrate the filtering method, and the experiment results have shown the effectiveness and advantages of the filter method.
Quantitative phase retrieval in dynamic laser speckle interferometry

Y.H. Huang,S.Y. Hung,Farrokh Janabi-Sharifi,W. Wang,Y.S. Liu

DOI: https://doi.org/10.1016/j.optlaseng.2011.06.025

IF: 5.666

2012-01-01

Optics and Lasers in Engineering

Abstract:The rapid progress of modern manufacturing and inspection technologies has posed stringent requirements on optical techniques for vibration characterization and dynamic testing. Due to its simplicity, accuracy and whole-field characters, laser speckle interferometry has served as one of the major techniques for dynamic measurement. In this paper, a two-step phase shifting method is developed for quantitative speckle phase measurement, which helps to eliminate the specklegrams needed for phase evaluation and facilitate dynamic measurement. Unlike previously reported two-step methods using fringe patterns with known phase shift of π/2, a small unknown phase shift is employed instead in the proposed method, which eliminates the need for phase shifting devices. Further investigation shows that small phase shifts are preferable over large phase shifts in this method. Shearographic experiments conducted have demonstrated the effectiveness of the proposed technique.
Real-Time One-Point Out-Of-Plane Displacement Measurement System Using Electronic Speckle Pattern Interferometry

Chen Xiong,Wenxin Hu,Ming Zhang,Hong Miao

DOI: https://doi.org/10.1117/1.oe.55.12.121721

IF: 1.3

2016-01-01

Optical Engineering

Abstract:We propose an electronic speckle pattern interferometry-based measurement method in which a hardware device in the reference arm is used to track the out-of-plane displacement in the objective arm. We developed a real-time one-point out-of-plane displacement measurement system, which uses a Michelson interferometer, a lead zirconate titanate (PZT) device, a charge-coupled device camera, and a tracking control system. The system works by checking the movement of carrier fringes, and the PZT is used to track the displacement. We also developed an efficient tracking algorithm based on direction judgment and correlation computation to determine whether the PZT is activated and the distance that the PZT is ordered to move. Our experimental results demonstrate the effectiveness of the system, and finally, we discuss the detailed mechanism of the system. (C) 2016 Society of Photo-Optical Instrumentation Engineers
A Method for Improving Quality of DSPI Measurement

Shuhai Jia,Xing Zhou,Hongqiang Yu,Shunjian Xu,Xin Wang

DOI: https://doi.org/10.1080/09500340.2021.1876262

IF: 1.3

2021-01-01

Journal of Modern Optics

Abstract:Digital speckle pattern interferometry (DSPI) has a wide variety of useful applications but suffers from speckle noise that cannot be easily removed using conventional filtering. We study a method by which the contrast of speckle interference fringes may be enhanced, thus improving the measurement quality of DSPI. The results demonstrate both improved the fringe contrast and an improvement in the quality of the speckle fringes by reduction of the speckle noise is. When combined with a phase-stepping algorithm, the quality of the DSPI measurement is significantly improved. Finally, the measurement results of deformation using contrast enhancement also show improvement when compared with conventional filtering.
Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry

Wenbo Jiang,Tong Ren,Qianhua Fu

DOI: https://doi.org/10.3390/electronics13020418

IF: 2.9

2024-01-20

Electronics

Abstract:Electronic speckle pattern interferometry (ESPI) is widely used in fields such as materials science, biomedical research, surface morphology analysis, and optical component inspection because of its high measurement accuracy, broad frequency range, and ease of measurement. Phase extraction is a critical stage in ESPI. However, conventional phase extraction methods exhibit problems such as low accuracy, slow processing speed, and poor generalization. With the continuous development of deep learning in image processing, the application of deep learning in phase extraction from electronic speckle interferometry images has become a critical topic of research. This paper reviews the principles and characteristics of ESPI and comprehensively analyzes the phase extraction processes for fringe patterns and wrapped phase maps. The application, advantages, and limitations of deep learning techniques in filtering, fringe skeleton line extraction, and phase unwrapping algorithms are discussed based on the representation of measurement results. Finally, this paper provides a perspective on future trends, such as the construction of physical models for electronic speckle interferometry, improvement and optimization of deep learning models, and quantitative evaluation of phase extraction quality, in this field.

engineering, electrical & electronic,computer science, information systems,physics, applied

Electronic speckle interferometry video phase-locked system

Novel Phase-Locked Electronic Speckle Pattern Interferometry

The System of Double-Optical-path ESPI for the Vibration Measurement

Phase Error Correction by &Lt;inline-Formula&gt;&lt;math Display="inline" Overflow="scroll"&gt;&lt;mi&gt;π&lt;/mi&gt;&lt;/math&gt;&lt;/inline-Formula&gt;-shift Odd-Step Fringe Projection and Speckle Filtering in Phase Measuring Profilometry

Angle measurement method of electronic speckle interferometry based on Michelson interferometer

Phase-coded Speckle Illumination for Laser Fourier Ptychographic Microscopy

Ghost Imaging with N-order Speckle Light

Image processing of ESPI based on measurement the welding dynamic displacement fields

Phase continuous scanning ESPI technique for measuring vibration mode

Electronic Speckle-Shearing Patten Interferometry for Vibration Analysis

High/Low-Precision Digital Speckle Pattern Interferometry for Vibration Measurement

Design and experiment of electronic speckle shearing phase-shifting pattern interferometer

Dynamic Phase Evaluation in Sparse-Sampled Temporal Speckle Pattern Sequence

New Optical Head and System of Espi

Vibration Analysis Based on Electronic Stroboscopic Speckle--Shearing Pattern Interferometry

Low-frequency harmonic vibration analysis with temporal speckle pattern interferometry

Filtering Method for Phase Fringe Patterns in the Digital Speckle Pattern Interferometry

Quantitative phase retrieval in dynamic laser speckle interferometry

Real-Time One-Point Out-Of-Plane Displacement Measurement System Using Electronic Speckle Pattern Interferometry

A Method for Improving Quality of DSPI Measurement

Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry

Phase Error Correction by &Lt;inline-Formula><math Display="inline" Overflow="scroll"><mi>π</mi></math></inline-Formula>-shift Odd-Step Fringe Projection and Speckle Filtering in Phase Measuring Profilometry