Study on method of testing low layer protocols based on TTCN-3
SUN Jing,SHANG Xing-xing,ZHAO Hui-qun,ZHU Peng-bin
DOI: https://doi.org/10.3969/j.issn.1001-3695.2010.11.044
2010-01-01
Abstract:TTCN-3 test language can be applied not only to the ordinary protocol test,but also can be applied to hardware systems,application service systems,as well as the service-oriented underlying protocol which related with operating system and hardware.This paper put conformance testing methodology and framework applicable to TTCN-3,developed a new method of conformance test according to the platform which developed by our laboratory,on the basis of the existing test method,and took ARP example which was tested according to the new method,came to the conclusion of the test results to verify the conformance of the ARP,and the possible of TTCN-3 language used in the low layout protocol test.