Characterization of Anisotropic Conduction of Horizontally Aligned Carbon Nanotube Thin Films

Si Li,Wei Hua,Min Liang,MingGuang Tuo,Sameh Tawfick,John Hart,Qi Zhu,Hao Xin
DOI: https://doi.org/10.1109/aps.2013.6711233
2013-01-01
Abstract:In this paper, the anisotropic conductivities of Horizontally Aligned Carbon Nanotube (HACNT) thin film are characterized using Vector Network Analyzer (VNA) and four-probe technique. For microwave (X-band), the transmission experiments are performed in a waveguide setup and the conductivities of HACNT thin film are extracted using the uniform field approximation. For two CNTs orientation directions, the results are about 1000 S/m and 3000 S/m, respectively. The DC conductivities are measured using the four-probe method. The average conductivities are 1360 S/m and 1903 S/m, respectively. These results confirm the anisotropic conduction of HACNT thin film.
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