An atomic force microscopy study of single-layer fese superconductor

Na Li,Zhi Li,Hao Ding,Shuaihua Ji,Xi Chen,Qikun Xue
DOI: https://doi.org/10.7567/APEX.6.113101
IF: 2.819
2013-01-01
Applied Physics Express
Abstract:The single-layer iron selenide (FeSe) superconductor is becoming an ideal system to study the mechanism of high-temperature superconductivity. In this work, we use atomic force microscopy (AFM) to demonstrate that: (1) unidirectional stripe in the single-layer FeSe film is purely an electronic feature instead of lattice reconstruction; (2) the charge transfer from the SrTiO3 substrate to FeSe plays an important role in inducing superconductivity in single-layer FeSe. Both short-range and long-range forces are exploited in the study. The combination of AFM with scanning tunneling microscopy opens a new opportunity to investigate the mechanism of high-T-c materials. (C) 2013 The Japan Society of Applied Physics
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