Research of Assisted Testing Method Based on Software Testability and Pattern

Feng Xie,Yi Chen Wang
DOI: https://doi.org/10.4028/www.scientific.net/amr.756-759.2265
2013-01-01
Advanced Materials Research
Abstract:Pattern is a highly sophisticated solution. The purpose of combining pattern and software testability together is to propose the assisted testing methoda pattern methodto solve the repeated software problems which are not defects but always appear during testing, the method involves many patterns. The ways to obtain the method are researching many testing processes, then analyze and summarize. The method could overcome shortcomings of other testability design and measurement methods. Using steps of the method is illustrated in this paper. Simple and rapid are the advantages of the operation process of the method which could be proved in the case study; whats more, it solved the problems that related to the pattern effectively. It can greatly assist with testing process and improve software testability. Its a practical and effective method.
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