A Multiview Interclass Dissimilarity Feature Fusion SAR Images Recognition Network Within Limited Sample Condition
Benyuan Lv,Jiacheng Ni,Ying Luo,S. Y. Zhao,Jia Liang,Hang Yuan,Qun Zhang
DOI: https://doi.org/10.1109/jstars.2024.3457022
IF: 4.715
2024-10-11
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Abstract:In Synthetic aperture radar (SAR) recognition tasks, due to its special imaging principle, SAR images acquired from different viewpoints contain target features that may carry a large amount of information. However, if recognition is forced by fusion of multiview features when raw data is scarce, feature redundancy will be formed, which in turn will lead to a decrease in recognition accuracy. To remedy the above problem, a multiview inter-class dissimilarity feature fusion (MIDFF) network is proposed in this study. The proposed network has multiple parallel inputs and can extract multiview features and heterogeneous features. Firstly, a method for rapidly generating sufficient training data for MIDFF is proposed, which generates training data by repeatedly combining images from different views and classes to ensure that a large number of training inputs are available even when raw SAR images are scarce. Secondly, a method of calculating and enhancing of inter-class dissimilarity (ICD) features is proposed to increase the inter-class distance and improve the inter-class separability. Then, the ICD and multiview features are fused to increase the features learned by the network and reduce feature redundancy. Finally, a multiview heterogeneous weighted loss function is proposed, which combines the calculation of inter-class similarity and heterogeneous loss. Through the gradual convergence of the loss function, the inter-class similarity decreases as the loss decreases, which further improves the target recognition performance. Experimental results on MSTAR and Civilian Vehicle SAR datasets show that our proposed method performs better than the state-of-the-art methods within sample scarcity conditions.
imaging science & photographic technology,remote sensing,engineering, electrical & electronic,geography, physical