A Novel Automatic Testing System Close-loop Model Based on Event Feedback

Shuai Wang,Yindong Ji,Wei Dong,Xinya Sun,Yafang Liu
DOI: https://doi.org/10.3923/itj.2013.2943.2949
2013-01-01
Information Technology Journal
Abstract:Tsting is essential for system verification and quality assurance. Most of the obtained results on testing focus on how to generate test cases and how to achieve a given goal optimally with a testing strategy. However, how to carry out testing automatically may be another very important and useful problem. In this field, how to model the automatic testing system and how to design the automatic test controller based on the model are the two key problems which are similar with the core problems of automatic control theory. Now the research reports on this direction are very few. In this study, we proposed a novel automatic testing system model based on controlled automata. The test controller, system under test and test observer compose a close-loop testing system based on event feedback. Meanwhile the construction methods of the automatic test controllers were given. We also captured the control mechanism in the algebraic framework of parallel composition of automata for the close-loop testing system. © 2013 Asian Network for Scientific Information.
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