An Inverse Random Source Problem In Quantifying The Elastic Modulus Of Nanomaterials

Gang Bao,Xiang Xu
DOI: https://doi.org/10.1088/0266-5611/29/1/015006
IF: 2.408
2013-01-01
Inverse Problems
Abstract:Nanotechnology deals with structures sized between 1 and 100 nanometer and involves manipulating and controlling materials or devices within that scale. Due to its small size, it is difficult to quantify the mechanical properties of nanomaterials which significantly rely on measurement techniques, conditions and environment. In this paper, to describe the elastic deformation of nanobelts obtained from an atomic force microscope (AFM) under contact mode, we propose a novel model based on a Euler-Bernoulli equation with a stochastic source term accounting for effects of initial bending, surface roughness and white noise during measurements. With the random source, the forward problem is demonstrated to have a unique and explicit path-wise solution. Furthermore, the inverse problem consists of identifying the elastic modulus of nanobelts and reconstructing the random source structure, i.e. the mean and the variance. Based upon explicit formulae of direct problems, the corresponding inverse problem can be reduced into a first kind of Fredholm-type integral equation where two kinds of regularization techniques are applied to obtain stable solutions, i.e. Tikhonov regularization (TR) for smooth solutions and a statistical regularization method from Bayes' formula and maximum likelihood estimation for discontinuous solutions, respectively. Numerical examples are presented to illustrate the validity and effectiveness of the proposed methods.
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