Stretching Single Atom Contacts at Multiple Subatomic Step-Length

Yi-Min Wei,Jing-Hong Liang,Zhao-Bin Chen,Xiao-Shun Zhou,Bing-Wei Mao,Oscar A. Oviedo,Ezequiel P. M. Leiva
DOI: https://doi.org/10.1039/c3cp50473e
2013-01-01
Abstract:This work describes jump-to-contact STM-break junction experiments leading to novel statistical distribution of last-step length associated with conductance of a single atom contact. Last-step length histograms are observed with up to five for Fe and three for Cu peaks at integral multiples close to 0.075 nm, a subatomic distance. A model is proposed in terms of gliding from a fcc hollow-site to a hcp hollow-site of adjacent atomic planes at 1/3 regular layer spacing along with tip stretching to account for the multiple subatomic step-length behavior.
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