Diagnosis of Incipient Faults in Weak Nonlinear Analog Circuits

Yibing Shi,Yong Deng,Wei Zhang
DOI: https://doi.org/10.1007/s00034-013-9589-0
2012-01-01
Metrology and Measurement Systems
Abstract:Aiming at the problem to diagnose incipient faults in weak nonlinear analog circuits, an approach is presented in this paper. The approach calculates the fractional Volterra correlation functions beforehand. The next step is to use the fractional Volterra correlation functions and different angle parameters of the fractional wavelet packet transform (FRWPT) to extract the fault signatures. Meanwhile, the computational complexity is analyzed. Then the variables of the fault signatures are constructed, which are used to form the observation sequences of the hidden Markov model (HMM). HMM is used to accomplish the fault diagnosis. The simulations show that the presented method can significantly improve the incipient fault diagnosis capability.
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