Plasmonic Refraction‐induced Ultrahigh Transparency of Highly Conducting Metallic Networks
Ruopeng Li,Qiang Peng,Bing Han,Yuanyu Ke,Xin Wang,Xubing Lu,Xueyuan Wu,Jiantao Kong,Zhifeng Ren,Eser Metin Akinoglu,Michael Giersig,Guofu Zhou,Jun-Ming Liu,Krzysztof Kempa,Jinwei Gao
DOI: https://doi.org/10.1002/lpor.201500271
2016-01-01
LASER & PHOTONICS REVIEWS
Abstract:We demonstrate a high optoelectronic performance and application potential of our random network, with subwave-length diameter, ultralong, and high-quality silver nanowires, stabilized on a substrate with a UV binder. Our networks show very good optoelectronic properties, with the single best figure of merit of similar to 1686, and excellent stability under harsh mechanical strain, as well as thermal, and chemical challenge. Our network transparency strongly exceeds the simple shading limit. We show that this transmission enhancement is due to plasmonic refraction, which in an effective medium picture involves localized plasmons, and identify the inhomogeneous broadening as the key factor in promoting this mechanism. Such networks could become a basis for a next generation of ultrahigh-performance transparent conductors.