The Friction Forces Between Si Tip and Multilayer Graphene

Yan Zhang,Yingying Wang,Yunfei Chen,Yujuan Wang
DOI: https://doi.org/10.1115/imece2012-87131
2012-01-01
Abstract:Mechanical peeling method is used to prepare multilayer graphene on silicon wafer with natural oxide, and the layer number of graphene is determined through atomic force microsopy (AFM) topography image and optical image. The friction force between Silicon tip and multilayer graphene and SiO2/Si substrates is measured with AFM. It is found that the friction force is reduced with the increase of the graphene layer number and approaches the value between the Si tip and graphite. Through comparing the tip sliding on graphene with different layers, the deformation of graphene is believed to be the main reason causing the decrease of the friction force with the layer number. When the normal load is much larger than the adhesion force, friction force increases with normal load linearly. However, while normal load closes to the adhesion force, friction force is independent of the normal load.
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