System Performances of On-Chip Silicon Microring Delay Line for RZ, CSRZ, RZ-DB and RZ-AMI Signals
Qiang Li,Fangfei Liu,Ziyang Zhang,Yikai Su
DOI: https://doi.org/10.1109/JLT.2008.2005510
2008-01-01
Abstract:We theoretically study the group-delay characteris- tics of a silicon microring resonator based on the coupled mode theory, and experimentally demonstrate error-free operations of an on-chip delay line using a silicon-on-insulator (SOI) microring resonator with a 20- m radius. Four signals of different modula- tionformatsareexaminedat5Gb/s,includingreturn-to-zero(RZ), carrier-suppressed return-to-zero (CSRZ), return-to-zero duobi- nary (RZ-DB), and return-to-zero alternate-mark-inversion (RZ- AMI). Bit error rate (BER) measurements show that the maximal delaytimeswitherror-freeoperationsare80,95,110,and65ps,re- spectively,correspondingtoafractionalgroupdelayof 0.4, 0.5, 0.55, and 0.35. The differences in delay and signal degrada- tionshavebeeninvestigatedbasedonthesignalspectraandpattern dependences.Althoughthedelaysaredemonstratedinasinglering resonator, the analysis is applicable in slow-light resonance struc- tures such as all-pass filters (APF) and coupled resonator optical waveguides (CROW).