Analysis of Measuring Errors of Micro-Deformation Using Speckle Digital Image Correlation

Zhong Chen,Xianmin Zhang,Xiaofeng Zhou
DOI: https://doi.org/10.1109/3m-nano.2012.6472959
2012-01-01
Abstract:Speckle digital image correlation (DIC) method has extended its application to micro-deformation measurement in nanoscale except for in microscale and macroscale. Because of its micro-deformation errors mainly depend upon the correct selection of the parameters of DIC method and its hardware setup, key parameters and how these parameters influence the measuring accuracy should be clarified in detail. So the micro-deformation measuring errors using DIC method are evaluated in different conditions of the parameters in deformation simulation experiments and the practical tensile test experiments, considering the difficulties of micro-deformation measuring experiment setup in nanoscale, and Some suggestions has been presented.
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