Super-resolution Imaging by Fluorescence Emission Difference (FED) Microscopy

Shuai Li,Cuifang Kuang,Xiang Hao,Zhaotai Gu,Xu Liu
2013-01-01
Abstract:We have proposed a novel microscopy method based on the intensity difference of two differently acquired images. A resolving ability of λ / 4 which is beyond the diffraction limit has been demonstrated by the experimental results.
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