A PVT Insensitive BCT Circuit with Replica Calibration for High Speed Charge-Domain Pipelined ADCs

Shuang Zhu,Hong Zhang,Xue Li,Dong Li,Zhenhai Chen,Jun Cheng
DOI: https://doi.org/10.1109/icsict.2012.6467897
2012-01-01
Abstract:A boosted charge transfer (BCT) circuit with replica calibration for high-speed charge domain (CD) pipelined analog to digital converters (ADCs) is presented in this paper. The common-mode charge errors caused by PVT variations can be rejected by the negative feedback network inside the replica circuit of the BCT. A 250-MSPS, 10bit CD pipelined ADC based on the proposed BCT achieves a SNDR of 56.7dB without digital calibration. The ADC is fabricated with SMC 0.18 μm CMOS process and consumes 150mW from a 1.8V power supply.
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