Effects of Atomic Force Microscope Silicon Tip Geometry on Large-Scale Nanomechanical Modification of the Polymer Surface

Yongda Yan,Xuesen Zhao,Zhenjiang Hu,Dawei Gao
DOI: https://doi.org/10.1080/10402004.2012.720001
IF: 2.056
2012-01-01
Tribology Transactions
Abstract:The shape of an atomic force microscope (AFM) silicon tip has a significant effect on the mechanical modification of the polymer surface, especially for a longer sliding distance of from several to several hundreds of millimeters. In this work, a pyramidal silicon tip was used to cut into the polymethyl methacrylate (PMMA) surface, forming nanogrooves with a linear sliding distance of about 80mm and wear box structures with a total tip sliding distance of 1,024mm. The effects of the tip edges and the tip radius on the form of the wear debris chips, wear depth, and debris transferred to the tip were investigated. The experimental results showed that four sides of the tip influenced the morphology of the removed material. Adhesion appeared to play a role in the tip wear mechanism by successive removal of SiO2 layers during transfer of adhered PMMA from the tip to the surface. The tip radius generally increased with sliding distance. Simultaneously, adhesion of the removed materials to the tip induced a larger tip radius and a sharper tip was revealed as dropping off of the materials during the test from time to time. Thus, with the same normal load the worn tip may induce failure of the machining process. The results presented in this study provide insight into long-term nanoscratch/wear and nanomechanical machining of glassy polymer surfaces with a silicon AFM tip.
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