On A Semiparametric Regression Model Whose Errors Form A Linear Process with Negatively Associated Innovations

Han-Ying Liang,Volker Mammitzsch,Josef Steinebach
DOI: https://doi.org/10.1080/02331880600688163
IF: 2.346
2006-01-01
Statistics
Abstract:In this article, we are concerned with the regression model y(i) = x(i) beta + g (t(i)) + V-i (1 <= i <= n), where the known design points (x(i), t(i)), the unknown slope parameter beta, and the nonparametric component g are non-random and where the correlated errors V-i = Sigma(infinity)(j=-infinity)c(j)e(i-j), with Sigma(infinity)(j=-infinity)\c(j)\ < infinity and negatively associated e(i), are random variables. Under appropriate conditions, we study the asymptotic normality for the least squares estimator of beta and the nonparametric estimator of g(.). Moreover, strong convergence rates of these estimators are considered. Our results show that the nonparametric estimator of g(.) can attain the optimal convergence rate.
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