Test Selection Based on Binary Particle Swarm Optimization

Jiang Ronghua,Wang Houjun,Long Bing
DOI: https://doi.org/10.13382/j.jemi.2008.02.018
2008-01-01
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT
Abstract:This paper firstly applies particle swarm optimization algorithm to test selection.Based on characteristics of test selection,it redefines particles and velocities of BPSO(Binary Particle Swarm Optimization).It optimizes the particles using fitness function that includes the indexes of test selection and introduces linearly decreasing weight to BPSO according to its characteristic of getting into local optimal easily.It also evaluates the test with the probability of the occurrence of faults,which has high values in practical application.Experimental results show that the proposed algorithm can not only achieve higher fault detection rate,isolation rate and more compact test sets when compared with other similar test selection algorithms,but also detect the faults with higher probability quickly.
What problem does this paper attempt to address?