Residual-based T2 control chart for monitoring multivariate auto-correlated processes

SUN Jing,YANG Muer
DOI: https://doi.org/10.3321/j.issn:1000-0054.2007.12.024
2007-01-01
Abstract:Traditional statistical process control(SPC) techniques are based on the assumption that the statistical data are independent,but such a fundamental condition cannot be satisfied in auto-correlated and cross-correlated multivariate processes.This paper presented a residual-based T2 control chart for general multivariate auto-correlated processes with known parameters,with an expression for the mean shifts of multivariate auto-correlated processes.Average run lengths with various mean shifts were obtained using Monte Carlo simulations.The average run lengths were related to the mean shifts for a residual-based T2 control chart.The results show that the residual-based T2 control chart can effectively monitor multivariate auto-correlated processes even if the shifts are not extremely small.
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