Study on Electrical Characteristics of Ge-pMOSFET with Ultrathin High-k Gate Dielectrics

陈娟娟,徐静平,陈卫兵
IF: 1.992
2009-01-01
Microelectronics Journal
Abstract:Using MEDICI simulator,a series of electric characteristics of Ge-MOSFET with ultrathin high-k gate dielectrics was studied.With short channel-length effect and fringe field effect taken into consideration,impact of gate dielectric constant,fixed oxide charge area density and channel length on threshold voltage and sub-threshold slope was analyzed.It has been concluded that it is necessary to have a gate dielectric k value below 50 and an interface fixed oxide charge area density less than 1.0×1012 cm-2 for better electric characteristics.
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