Leather surface inspection using automatic selection band for wavelet reconstruction

He Fuqiang,Wang Wen,Chen Zichen
DOI: https://doi.org/10.3321/j.issn:0254-3087.2006.z1.122
2006-01-01
Abstract:Defects detection for texture surface is one of the important research problems in machine vision,and can be widely used in surface quality control of different products.This paper is focused on the analysis of leather surface inspection to manufacturing industries.A defect detection approach for texture image,which uses an efficient image restoration scheme in wavelet domain,is presented.First,the texture image is decomposed by using wavelet base function in terms of the optimum decomposition levels,and then the restoration image can be reconstructed by properly selecting the smooth subimage or the detail subimages at best resolution levels.The homogeneous texture pattern can be effectively removed and only local defects are preserved in the restored image.A subband selection procedure is developed to automatically determine the best reconstruction parameters based on the energy distribution of wavelet coefficients.Experiments demonstrate the validity of the method,and show the potential possibility of real-time processing in an on-line leather surface inspection.
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