Dielectric property of binary phase composite and its interface investigated by electric force microscope

Sun Zhi,Wang Xuan,Han Bai,Song Wei,Zhang Dong,Guo Xiang-Yu,Lei Qing-Quan
DOI: https://doi.org/10.7498/aps.62.030703
IF: 0.906
2013-01-01
Acta Physica Sinica
Abstract:Dielectric property of two-phase stack-up sample is studied by electric force microscopy (EFM). Highly oriented pyrolytic graphite (HOPG)/polyethylene(PE) and mica/PE are fabricated. The phenomenon that phase shift ( Δθ ) of conducting probe varys with dielectric constant of material is discovered near the interface between the two materials by using phase detection EFM. The characteristic curves of tan( Δθ ) versus tip voltage V (EFM) are of parabolic type. Quadratic coefficient increases with dielectric constant ε increasing. An approach to the qualitative analysis of the dielectric property near the interface between different material at the micro/nanometer scale, is provided in this paper.
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