Fabric defect detection based on support vector machine

GAO Xiao-ding,GAO Bin,ZUO He,XIN Wen-hui
DOI: https://doi.org/10.3321/j.issn:0253-9721.2006.05.008
2006-01-01
Abstract:For effective detection and classification of numerous kinds of fabric defect using a machine,an algorithm for fabric defect detection based on dimensional histogram statistic and support vector machine is proposed,which uses dimensional histogram statistic method to generate dimensional histogram waveform and precisely locates the abnormal site on the fabric texture by comparing the parameters of the waveform characteristics and correctly identifies the defect of the fabric.The parameters are input into the support vector machine and used to train the samples with typical characteristics for obtaining support vectors.The target fabric is detected for its defects and the results are compared to find out the optimal match.The images of the target fabric are put into the best matching group.The experiments show this method is feasible and effective in fabric defect detection and satisfactory identification result can be achieved.
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