Dielectric Relaxation of Suspensions of Nanoscale Particles Surrounded by a Thick Electric Double Layer

Kongshuang Zhao,Kejuan He
DOI: https://doi.org/10.1103/physrevb.74.205319
IF: 3.7
2006-01-01
Physical Review B
Abstract:Dielectric relaxations of suspensions of nanoscale silica particles surrounded by a thick electric double layer are investigated to examine the effect of the concentration of particles. It is found that at low concentrations, the low-frequency dispersion gradually merges with the high-frequency one to become a broad dispersion. The relaxation mechanisms are discussed by using the observed relaxation time. The low-frequency dispersion is caused by the electric double layer polarization while the high-frequency dispersion results from the interfacial polarization. The inner characteristics of the dispersed particles and the dispersing media are obtained from a two-step analytical method developed by the authors [K. He and K. Zhao, Langmuir 21, 11878 (2005)]. With the results of the analysis, Hill's standard electrokinetic model is employed to interpret the merging of the low- and high-frequency dispersions. The discrepancy between the experimentally observed $\ensuremath{\chi}a$ and that derived from the model estimation is preliminarily explained by the overlap of an electric double layer.
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