Negative Delay Memory Testing Method Based on Wireless-control

LI Yajuan,YOU Wenbin,YANG Zhuojing,ZU Jing
DOI: https://doi.org/10.3969/j.issn.1008-1194.2011.04.004
2011-01-01
Abstract:Aiming at the problems such as hard wiring,large interference,unable real-time monitoring and accessing data and so on of the traditional method of the shock wave overpressure testing in harsh environment.This paper promoted a negative delay testing method with wireless monitoring,which consisted of sensors,adaptive amplifier,A/D converter,memory,control circuit,interface,battery.Storage device used the MCU and CPLD controlling two NAND flash memory with negative delay function to storage fast and completely.The testing trigger,acquisition and data return etc.were controlled by Zigbee wireless sensor network.Experiments results showed that the new storage method had the advantages of wireless remote control,small size,low power consumption,high impact resistance and other characteristics,and was reliable and effective,which is suitable for data recording and timely returning in harsh environments.
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